Balisticity caractérisation électrique conference dérive-diffusion Electron Device Letters extraction technique fonction-Y Injection Velocity longueur effective Mendeley mobilité MOSFET méthodologie d’extraction performance. References Saturation Velocity series resistance Symposium on VLSI-TSA Symposium on VLSI Technology Taiwan transistor MOS transport balistique Communities (2) conferences (1) Conferences (2) Journals (2) Links (2) News (1) PhD Dissertation (1) Publications (4)
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